2 k 2 k orius 830 ccd camera Search Results


digitalmicrograph software  (Gatan Inc)
93
Gatan Inc digitalmicrograph software
Digitalmicrograph Software, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 93/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2+k+2+k+orius+830+ccd+camera/DigitalMicrograph+Software/custom%40700%2Els%2E700%2E00%2E64%2E1%4027069798
Average 93 stars, based on 1 article reviews
digitalmicrograph software - by Bioz Stars, 2026-10
93/100 stars
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uranyl acetate  (Polysciences inc)
90
Polysciences inc uranyl acetate
Uranyl Acetate, supplied by Polysciences inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2+k+2+k+orius+830+ccd+camera/uranyl+acetate/pmc06479287-216-5-7
Average 90 stars, based on 1 article reviews
uranyl acetate - by Bioz Stars, 2026-10
90/100 stars
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gatan 830 sc200 orius charge  (Gatan Inc)
97
Gatan Inc gatan 830 sc200 orius charge
Gatan 830 Sc200 Orius Charge, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2+k+2+k+orius+830+ccd+camera/DigitalMicrograph+Software/pmc04824898-118-5-4
Average 97 stars, based on 1 article reviews
gatan 830 sc200 orius charge - by Bioz Stars, 2026-10
97/100 stars
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saed patterns  (Gatan Inc)
94
Gatan Inc saed patterns
(a, <t>b)</t> <t>BF–TEM</t> images and <t>SAED</t> patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, as-deposited; (c, d) BF–TEM images and SAED patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, after 75 keV electron irradiation (carried out at 298 K for 3.6 ks); (e) intensity profiles of SAED patterns measured in the radial direction.
Saed Patterns, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 94/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2+k+2+k+orius+830+ccd+camera/DIFPACK+Module/pmc08388104-95-5-18
Average 94 stars, based on 1 article reviews
saed patterns - by Bioz Stars, 2026-10
94/100 stars
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Image Search Results


(a, b) BF–TEM images and SAED patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, as-deposited; (c, d) BF–TEM images and SAED patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, after 75 keV electron irradiation (carried out at 298 K for 3.6 ks); (e) intensity profiles of SAED patterns measured in the radial direction.

Journal: ACS Omega

Article Title: Athermal Solid Phase Reaction in Pt/SiO x Thin Films Induced by Electron Irradiation

doi: 10.1021/acsomega.1c03604

Figure Lengend Snippet: (a, b) BF–TEM images and SAED patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, as-deposited; (c, d) BF–TEM images and SAED patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, after 75 keV electron irradiation (carried out at 298 K for 3.6 ks); (e) intensity profiles of SAED patterns measured in the radial direction.

Article Snippet: All the TEM images and SAED patterns were recorded using 2 k × 2 k charge-coupled device cameras (Gatan Orius and UltraScan1000).

Techniques: Irradiation

(a) Intensity profiles of the SAED patterns obtained for Pt/a-SiO x and a-SiO x /Pt/a-SiO x composite thin films after 75 keV electron irradiation at 298 K for 3.6 ks. (b) Dose rate dependence of the integrated intensity ratios of 110 Pt2Si and 111 Pt reflections ( I 110 / I 111 ) at 298 K for 75 keV electrons.

Journal: ACS Omega

Article Title: Athermal Solid Phase Reaction in Pt/SiO x Thin Films Induced by Electron Irradiation

doi: 10.1021/acsomega.1c03604

Figure Lengend Snippet: (a) Intensity profiles of the SAED patterns obtained for Pt/a-SiO x and a-SiO x /Pt/a-SiO x composite thin films after 75 keV electron irradiation at 298 K for 3.6 ks. (b) Dose rate dependence of the integrated intensity ratios of 110 Pt2Si and 111 Pt reflections ( I 110 / I 111 ) at 298 K for 75 keV electrons.

Article Snippet: All the TEM images and SAED patterns were recorded using 2 k × 2 k charge-coupled device cameras (Gatan Orius and UltraScan1000).

Techniques: Irradiation

(a, b) BF–TEM images and SAED patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, as-deposited; (c, d) BF–TEM images and SAED patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, after 75 keV electron irradiation (carried out at 90 K for 3.6 ks); (e) intensity profiles of the SAED patterns measured in the radial direction.

Journal: ACS Omega

Article Title: Athermal Solid Phase Reaction in Pt/SiO x Thin Films Induced by Electron Irradiation

doi: 10.1021/acsomega.1c03604

Figure Lengend Snippet: (a, b) BF–TEM images and SAED patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, as-deposited; (c, d) BF–TEM images and SAED patterns, respectively, of an a-SiO x /Pt/a-SiO x composite film, after 75 keV electron irradiation (carried out at 90 K for 3.6 ks); (e) intensity profiles of the SAED patterns measured in the radial direction.

Article Snippet: All the TEM images and SAED patterns were recorded using 2 k × 2 k charge-coupled device cameras (Gatan Orius and UltraScan1000).

Techniques: Irradiation